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Showing results: 256 - 270 of 274 items found.

  • HDD-8261, 4 TB, 6-Drive, PXI Data Storage Module

    784191-01 - NI

    4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.

  • Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces

    JT 37x7/TSI - JTAG Technologies Inc.

    High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

  • Compute Express Link (CXL)

    Teledyne LeCroy

    Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.

  • Developers' Toolkits

    EnTech Taiwan

    If you are a hardware developer, using RapidDriver Explorer with just a couple of clicks, you can easily start testing and debugging your USB, ISA, PCI or Parallel Port device. You do not have to perform any additional steps - everything is already done!If you are a software developer, you can write your own application with the help of RapidDriver Developer, TVicHW32 or TVicPort without writing a device driver and being a DDK expert - we have already built-in generic device drivers for you! Our toolkits include many test examples on direct port i/o access, interrupt handling, physical memory access, reading specific hardware registers and USB pipes to help you getting started. We also allow redistribution of drivers and DLL's as part of your software without having to pay royalties.For the software developers, we also offer an option to purchase the drivers and DLL source code. The source code can be directly edited and compiled with MS Visual C/C++ or with the DDK "build" utility.Not sure what product to choose? Compare them by features or contact us.

  • 3U / 6U PXIe Chassis

    Marvin Test Solutions, Inc.

    The GX7100e Series are 14-slot combination PXIe chassis that accommodate a 3U PXIe embedded controller or a MXI express controller as well as 3U & 6U PXI / PXIe insruments in 4U of rack space. The GX7100e’s unique format includes seven 6U slots and seven 3U slots arranged horizontally to reduce the overall size of the chassis, providing the versatility and high-density necessary to address many PXI / PXIe applications and requirements. The backplane architecture supports Gen 2, 4x4 PCI Express bus signaling and the use of both x1 or x4 system controllers. By offering a combination of PXI-1, Hybrid, and Express slots, the GX7100e offers users the ultimate in flexibility for general purpose as well as high bandwidth test needs.

  • PXIe-6349, 32 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module

    785808-01 - NI

    PXIe, 32 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module - The PXIe-6349 offers analog I/O, digital I/O, and four 32-bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe-6349 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • 14-Slot Combination PXIe Chassis

    GX7100e Series - Marvin Test Solutions, Inc.

    The GX7100e Series are 14-slot combination PXIe chassis that accommodate a 3U PXIe embedded controller or a MXI express controller as well as 3U & 6U PXI / PXIe insruments in 4U of rack space. The GX7100e’s unique format includes seven 6U slots and seven 3U slots arranged horizontally to reduce the overall size of the chassis, providing the versatility and high-density necessary to address many PXI / PXIe applications and requirements. The backplane architecture supports Gen 2, 4x4 PCI Express bus signaling and the use of both x1 or x4 system controllers. By offering a combination of PXI-1, Hybrid, and Express slots, the GX7100e offers users the ultimate in flexibility for general purpose as well as high bandwidth test needs.

  • PXIe-6355, 80 AI (16-Bit, 1.25 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module

    783632-01 - NI

    PXIe, 80 AI (16-Bit, 1.25 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6355 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6355 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXIe-6345, 80 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module

    783631-01 - NI

    PXIe, 80 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6345 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6345 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXIe-6375, 208 AI (16-Bit, 3.8 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module

    783634-01 - NI

    PXIe, 208 AI (16-Bit, 3.8 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6375 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6375 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXIe-6341, 16 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module

    781052-01 - NI

    PXIe, 16 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6341 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6341 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • PXIe-6361, 16 AI (16-Bit, 2 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module

    781055-01 - NI

    PXIe, 16 AI (16-Bit, 2 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6361 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6361 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXIe-6365, 144 AI (16-Bit, 2 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module

    783633-01 - NI

    PXIe, 144 AI (16-Bit, 2 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6365 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6365 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • Combination Board Tester

    ATE QT2256-640 PXI - Qmax Test Technologies Pvt. Ltd.

    Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.

  • PCIe-6346 , 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device

    785813-01 - NI

    PCIe, 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe-6346 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality, leveraging the high-throughput PCI Express (PCIe) bus and multicore-optimized driver and application software. Because of its multi-ADC architecture, the device offers simultaneous sampling. Onboard NI-STC3 timing and synchronization technology deliver advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

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